Application of Nonredundant Sampling Representations of Electromagnetic Fields to NF-FF Transformation Techniques

An overview of the application of the band-limitation properties and nonredundant sampling representations of electromagnetic fields to NF-FF transformations is presented. The progresses achieved by applying them to data acquired on conventional NF scanning surfaces are discussed, outlining the remarkable reduction in the number of needed NF samples and measurement time. An optimal sampling interpolation expansion for reconstructing the probe response on a rotational scanning surface from a non-redundant number of its samples is also discussed. A unified theory of the NF-FF transformations with spiral scannings, which allow a remarkable reduction of the measurement time, is then reviewed by describing a sampling representation of the voltage on a quite arbitrary rotational surface from its nonredundant samples collected on a proper spiral wrapping it. Some numerical and experimental results assessing the effectiveness of the considered NF-FF transformations are shown too.