We show that curvature-induced inhomogeneous strain distributions in nanoscale buckled semiconducting ribbons lead to the existence of end states which are topologically protected by inversion symmetry. These end-state doublets, corresponding to the so-called Maue-Shockley states, are robust against weak disorder. By identifying and calculating the corresponding topological invariants, we further show that a buckled semiconducting ribbon undergoes topological phase transitions between trivial and nontrivial insulating phases by varying its real-space geometry.

Topological end states due to inhomogeneous strains in wrinkled semiconducting ribbons

Ortix, Carmine
2016-01-01

Abstract

We show that curvature-induced inhomogeneous strain distributions in nanoscale buckled semiconducting ribbons lead to the existence of end states which are topologically protected by inversion symmetry. These end-state doublets, corresponding to the so-called Maue-Shockley states, are robust against weak disorder. By identifying and calculating the corresponding topological invariants, we further show that a buckled semiconducting ribbon undergoes topological phase transitions between trivial and nontrivial insulating phases by varying its real-space geometry.
2016
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11386/4706743
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