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Mostrati risultati da 21 a 40 di 99
Titolo Data di pubblicazione Autore(i) File
Characterization of Very Thin Epitaxial Layers 1-gen-1988 Craig, Ransom; Bellone, Salvatore; Paolo, Spirito; Giovanni, Busatto; Giuseppe, Cocorullo
Experimental Detection of Module Failure in Large Photovoltaic Arrays: Application to the Delphos Photovoltaic Plant 1-gen-1989 Paolo, Spirito; Gianfranco, Vitale; Bellone, Salvatore; Angelo, Sarno; Felice, Apicella
Electrical Characterization of minority carrier transport parameters in n-type heavily doped silicon 1-gen-1989 Bellone, Salvatore; Giovanni, Busatto; Craig M., Ransom
Recombination Lifetime Profiling in Very Thin Silicon Epitaxial Layers used for Bipolar VLSI 1-gen-1989 Paolo, Spirito; Bellone, Salvatore; C., Ransom; Giovanni, Busatto; Giuseppe, Cocorullo
A New Test Structure for in-depth Lifetime Profiling of Thin Si Epitaxial Layers 1-gen-1989 Paolo, Spirito; Bellone, Salvatore; Craig M., Ransom; Giovanni, Busatto; Giuseppe, Cocorullo
Current Gain Enhancement Effect by Gate Doping in Bipolar Mode Field Effect Transistor 1-gen-1990 Bellone, Salvatore; Giuseppe, Cocorullo; G., Fallica; S., Musumeci
A New Test Structure for Recombination Measurements in Thin Silicon Layers for VLSI Structures 1-gen-1990 Bellone, Salvatore; Paolo, Spirito
Recombination Measurement of n-type Heavily Doped Layer in High-Low Silicon Junctions 1-gen-1991 Bellone, Salvatore; Giovanni, Busatto; C., Ransom
Detection of Recombination Centers in Epitaxial Layers by Temperature Scanning and Depth Lifetime Profiling 1-gen-1991 Bellone, Salvatore; Paolo, Spirito
Analytical Model for GaAs PIN diodes for a Wide Range of Currents and Temperatures 1-gen-1992 Bellone, Salvatore; Giuseppe, Cocorullo; FRANCESCO DELLA, Corte; H. L., Hartnagel; G., Schweeger
Experimental Analysis of the Temperature Dependence of the S.H.R. Lifetime and of the Apparent Bandgap Narrowing in n-type Silicon 1-gen-1993 Bellone, Salvatore; Paolo, Spirito
Analytical Model of GaAs BMFET Structures 1-gen-1994 Bellone, Salvatore; Niccolò, Rinaldi; Gianfranco, Vitale; Giuseppe, Cocorullo
Analytical Model of the Effective Recombination Velocity of Diffused p-p+ (n-n+) High-Low Junctions at Artbitrary Injection Level 1-gen-1994 Bellone, Salvatore; Giovanna, Lirer
A New Method for the Measurement of the Conductivity Mobility as a Function of the Injection Level in Silicon Regions 1-gen-1995 Bellone, Salvatore; Gian Vito, Persiano; Antonio Giuseppe M., Strollo; Santolo, Daliento
A Measurement Method of the Injection Level Dependence of the Conductivity Mobility in Silicon 1-gen-1995 Bellone, Salvatore; GIAN VITO, Persiano; ANTONIO G. M., Strollo
Electrical Measurement of Electron and Hole Mobilities as a Function of Injection Level in Silicon 1-gen-1996 Bellone, Salvatore; Gianvito, Persiano; ANTONIO G. M., Strollo
A Two-dimensional Analytical Model of Homojunction GaAs BMFET Structures 1-gen-1996 Bellone, Salvatore; Nicolo', Rinaldi; G. F., Vitale; Giuseppe, Cocorullo; G., Schweeger
A New Test Structure for the Evaluation of the Injection - Level Dependence of Carrier Mobilities 1-gen-1996 Gian Vito, Persiano; Bellone, Salvatore
Test structure Design for the Evaluation of Carrier-Carrier Scattering Effect on Hole and Electron Mobilities 1-gen-1997 Bellone, Salvatore; Gianvito, Persiano
A new Measurement Technique for the Conductivity Mobility versus Injection Level in Silicon 1-gen-1997 Bellone, Salvatore; Gianvito, Persiano; Antonio G. M., Strollo; Santolo, Daliento
Mostrati risultati da 21 a 40 di 99
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