This work deals with the numerical analysis of the zero-voltage state lifetimes distribution of an underdamped Josephson junction used for the detection of single microwave photons in the presence of thermal noise. The analysis considers the switching probabilities of a JJ subjected to a train of current pulses, which simulates a weak photon field. To characterize the detection, we take advantage of a statistic tool, the Kumar-Carroll (KC) index, which is a good proxy of the signal-to-noise-ratio. It can be, therefore, exploited to identify the proper device fabrication parameters and the optimal operation point of the junction.

Analysis of Josephson Junction Lifetimes for the Detection of Single Photons in a Thermal Noise Background

Piedjou Komnang A. S.
Investigation
;
Guarcello C.
Writing – Original Draft Preparation
;
Barone C.
Writing – Review & Editing
;
Pagano S.
Writing – Review & Editing
;
2021

Abstract

This work deals with the numerical analysis of the zero-voltage state lifetimes distribution of an underdamped Josephson junction used for the detection of single microwave photons in the presence of thermal noise. The analysis considers the switching probabilities of a JJ subjected to a train of current pulses, which simulates a weak photon field. To characterize the detection, we take advantage of a statistic tool, the Kumar-Carroll (KC) index, which is a good proxy of the signal-to-noise-ratio. It can be, therefore, exploited to identify the proper device fabrication parameters and the optimal operation point of the junction.
978-1-7281-9306-9
978-1-7281-9307-6
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11386/4770930
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