The paper describes a calibration procedure for a structured-light sinusoidal-fringe profilometer which requires the acquisition of images of a plane in one or more unknown poses when it is illuminated by sinusoidal fringe patterns projected by an illuminator. The procedure does not require specific target but only a planar surface which can be freely moved or rotated around a vertical axis
A Self-Calibration Procedure for a Sinusoidal Fringe Profilometer
BEVILACQUA, MAURIZIO;LANDI, MARCO;PAOLILLO, Alfredo
2012-01-01
Abstract
The paper describes a calibration procedure for a structured-light sinusoidal-fringe profilometer which requires the acquisition of images of a plane in one or more unknown poses when it is illuminated by sinusoidal fringe patterns projected by an illuminator. The procedure does not require specific target but only a planar surface which can be freely moved or rotated around a vertical axisFile in questo prodotto:
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