Numerical analysis of performance improvement available using lifetime control techniques able to control device carrier lifetime not only in the axial direction, but also in the longitudinal direction (2D lifetime control) is presented. Mixed mode numerical simulations are used to evaluate static and dynamic behavior of power PiN diodes using 2D lifetime control. The analysis shows that 2D lifetime control gives a better trade-off between static and dynamic behavior with respect to electron irradiation technique. Guidelines for optimal design are given. In the paper it is shown that 2D lifetime control is a very flexible design technique, since there are many lifetime profiles with similar effects on diode performance.
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