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EnglishAn extension of Hodgkinson's model for the principal refractive indexes and column-inclination angle of a columnar thin film against the vapor-incidence angle is presented for an extraordinary refractive index relevant,for many optical applications. Not only do the principal refractive indexes depend quadratically on the vapor incidence angle, but the extraordinary refractive index does as well. This model is expected to be valid for chiral sculptured thin films as well.
http://hdl.handle.net/11386/1060417| Titolo: | Extension of Hodgkinson's model for optical characterization of columnar thin films |
| Autori interni: | CHIADINI, FRANCESCO |
| Data di pubblicazione: | 2004 |
| Rivista: | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS |
| Abstract: | An extension of Hodgkinson's model for the principal refractive indexes and column-inclination angle of a columnar thin film against the vapor-incidence angle is presented for an extraordinary refractive index relevant,for many optical applications. Not only do the principal refractive indexes depend quadratically on the vapor incidence angle, but the extraordinary refractive index does as well. This model is expected to be valid for chiral sculptured thin films as well. |
| Handle: | http://hdl.handle.net/11386/1060417 |
| Appare nelle tipologie: | 1.1.1 Articolo su rivista con DOI |
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