Films of the rutheno-cuprate compound GdSr2RuCu2O8 were grown by on-axis dc sputtering technique, at temperature Ts = 837 °C and in pure oxygen atmosphere. Structural and compositional measurements have been performed on samples prepared on different substrates and at different ex situ annealing procedures. In particular, a detailed analysis of the structure and the local composition of the films have been obtained by high-resolution X-ray diffraction and by energy-dispersive X-ray microanalysis (EDX) of scanning electron microscope (SEM). The films resulted c-axis oriented and single phased. We show the results obtained on a sample deposited on LaAlO3 substrate, (1 0 0) oriented. Magnetic measurements as function of temperature from 1.9 K to 400 K and applied magnetic fields up to 7 T are discussed.

Structural and magnetic properties of GdSr2RuCu2O8 films

GUARINO, ANITA;NIGRO, Angela;ZOLA, Danilo;POLICHETTI, Massimiliano;VECCHIONE, ANTONIO;PACE, Sandro
2007-01-01

Abstract

Films of the rutheno-cuprate compound GdSr2RuCu2O8 were grown by on-axis dc sputtering technique, at temperature Ts = 837 °C and in pure oxygen atmosphere. Structural and compositional measurements have been performed on samples prepared on different substrates and at different ex situ annealing procedures. In particular, a detailed analysis of the structure and the local composition of the films have been obtained by high-resolution X-ray diffraction and by energy-dispersive X-ray microanalysis (EDX) of scanning electron microscope (SEM). The films resulted c-axis oriented and single phased. We show the results obtained on a sample deposited on LaAlO3 substrate, (1 0 0) oriented. Magnetic measurements as function of temperature from 1.9 K to 400 K and applied magnetic fields up to 7 T are discussed.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11386/2501339
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