A reliable estimation of the performances of two possible realizations of a CNT-based nano-interconnect, namely one obtained by using a bundle of SWCNT and another one employing a MWCNT, taking into account the variations of some physical and geometrical characteristics is carried out. The ranges of the per unit length parameters of a Transmission Line modeling the interconnect and those of the propagation time delay are analyzed for three different technologies (15, 21 and 32nm) by means of Interval Analysis. This approach provides, at once, a worstcase analysis and a sound assessment of the robustness and accuracy of the considered performance as a function of the interconnect length. A comparison of the two technological alternatives is carried out in a more consistent way than that usually achieved by considering the nominal behavior.
Impact of the Variability of the Process Parameters on CNT-based Nanointerconnects Performances: a Comparison Between SWCNTs Bundles and MWCNT
LAMBERTI, PATRIZIA;TUCCI, Vincenzo
2012-01-01
Abstract
A reliable estimation of the performances of two possible realizations of a CNT-based nano-interconnect, namely one obtained by using a bundle of SWCNT and another one employing a MWCNT, taking into account the variations of some physical and geometrical characteristics is carried out. The ranges of the per unit length parameters of a Transmission Line modeling the interconnect and those of the propagation time delay are analyzed for three different technologies (15, 21 and 32nm) by means of Interval Analysis. This approach provides, at once, a worstcase analysis and a sound assessment of the robustness and accuracy of the considered performance as a function of the interconnect length. A comparison of the two technological alternatives is carried out in a more consistent way than that usually achieved by considering the nominal behavior.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
