We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO2 / Si substrate. Measurements were performed in a scanning electron microscope chamber equipped with nanoprobes which allowed local measurement of the field emission current. We achieved field emission currents up to 1μA from the flat part of graphene flakes at applied fields of few hundred volt per micrometer. We found that the emission process is stable over a period of several hours and that it is well described by a Fowler–Nordheim model for currents over five orders of magnitude.

Field emission from graphene flakes

IEMMO, LAURA;Luongo, Giuseppe;DI BARTOLOMEO, Antonio
2016-01-01

Abstract

We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO2 / Si substrate. Measurements were performed in a scanning electron microscope chamber equipped with nanoprobes which allowed local measurement of the field emission current. We achieved field emission currents up to 1μA from the flat part of graphene flakes at applied fields of few hundred volt per micrometer. We found that the emission process is stable over a period of several hours and that it is well described by a Fowler–Nordheim model for currents over five orders of magnitude.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11386/4675686
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact