Bi2Sr2CaCu2Ox thin films have been obtained on MgO and sapphire substrates by complete electron-beam evaporation of a bulk pellet and subsequent ex-situ oxigen annealing. Careful control of the initial stoichiometry and of the annealing procedure allowed to obtain high quality films with TcO=85 K. The films were polycrystalline but highly textured with the c-axis perpendicular to the substrate plane and critical current density of 5·104 A/cm2. In order to test the microwave properties of the films an innovative method, based on the measure of the quality factor of a ring microstrip resonator, has been set up. Preliminary measurements of the surface impedance versus rf power of BSCCO films on MgO substrate are presented. © 1991.
Characterization and microwave properties of electron-beam deposited BSCCO films
ATTANASIO, Carmine;MARITATO, Luigi;NIGRO, Angela;VAGLIO, Ruggero
1991-01-01
Abstract
Bi2Sr2CaCu2Ox thin films have been obtained on MgO and sapphire substrates by complete electron-beam evaporation of a bulk pellet and subsequent ex-situ oxigen annealing. Careful control of the initial stoichiometry and of the annealing procedure allowed to obtain high quality films with TcO=85 K. The films were polycrystalline but highly textured with the c-axis perpendicular to the substrate plane and critical current density of 5·104 A/cm2. In order to test the microwave properties of the films an innovative method, based on the measure of the quality factor of a ring microstrip resonator, has been set up. Preliminary measurements of the surface impedance versus rf power of BSCCO films on MgO substrate are presented. © 1991.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
