A comparison between two different algorithms to measure the period of a signal is performed on this work. One of the algorithms is based on the Fast Fourier Transformation (FFT) measurement procedure, whereas the other is based on the Segmentation and Labeling algorithm (MCT). Both algorithms have been prepared for implementation in a microcontroller with ARM architecture. The measurement operation of each one of the algorithms is described in detail. Experimental results are reported, with the purpose of demonstrating both performance and output format for signal analysis.

A comparison between FFT and MCT for period measurement with an ARM microcontroller

Abate, F.;Pietrosanto, A.
2015-01-01

Abstract

A comparison between two different algorithms to measure the period of a signal is performed on this work. One of the algorithms is based on the Fast Fourier Transformation (FFT) measurement procedure, whereas the other is based on the Segmentation and Labeling algorithm (MCT). Both algorithms have been prepared for implementation in a microcontroller with ARM architecture. The measurement operation of each one of the algorithms is described in detail. Experimental results are reported, with the purpose of demonstrating both performance and output format for signal analysis.
2015
9781479961139
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11386/4715092
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