In this work, an effective near-field to far-field transformation (NFFFT) with planar wide-mesh scanning (PWMS) from NF data affected by known probe-positioning errors is experimentally validated. The related NFFFT from correctly positioned samples allows a remarkable measurement time saving, since the NF data needed by the classical plane-rectangular NFFFT are accurately reconstructed from a reduced number of PWMS samples via a non-redundant sampling representation of the probe voltage developed by shaping the antenna with an oblate ellipsoid. The voltage values at the sampling points specified from the representation are unknown and are effectively recovered by the inaccurately positioned ones by an iterative approach. Experimental results assessing the validity of such an approach are reported.
An iterative technique to retrieve the planar wide-mesh scanning near-field data from those affected by an inaccurate positioning
D'Agostino, Francesco;Ferrara, Flaminio;Gennarelli, Claudio;Guerriero, Rocco;Migliozzi, Massimo
2018-01-01
Abstract
In this work, an effective near-field to far-field transformation (NFFFT) with planar wide-mesh scanning (PWMS) from NF data affected by known probe-positioning errors is experimentally validated. The related NFFFT from correctly positioned samples allows a remarkable measurement time saving, since the NF data needed by the classical plane-rectangular NFFFT are accurately reconstructed from a reduced number of PWMS samples via a non-redundant sampling representation of the probe voltage developed by shaping the antenna with an oblate ellipsoid. The voltage values at the sampling points specified from the representation are unknown and are effectively recovered by the inaccurately positioned ones by an iterative approach. Experimental results assessing the validity of such an approach are reported.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.