Very weak left/right asymmetry in reflection and transmission is offered by a layer of a topological insulator on top of a layer of an anisotropic dielectric material, but it can be enhanced very significantly by using a periodic multilayer of both types of materials. This is an attractive prospect for realizing one-way terahertz devices, because both types of materials can be grown using standard physical-vapor-deposition techniques.

Enhanced left/right asymmetry in reflection and transmission due to a periodic multilayer of a topological insulator and an anisotropic dielectric material

Francesco Chiadini
;
Vincenzo Fiumara;Akhlesh Lakhtakia;Antonio Scaglione
2019

Abstract

Very weak left/right asymmetry in reflection and transmission is offered by a layer of a topological insulator on top of a layer of an anisotropic dielectric material, but it can be enhanced very significantly by using a periodic multilayer of both types of materials. This is an attractive prospect for realizing one-way terahertz devices, because both types of materials can be grown using standard physical-vapor-deposition techniques.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11386/4721112
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