Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under temperature or radiation stress. For all the investigated polymer:fullerene, silicon and perovskite solar cells this technique evidences a clear correlation of the recombination and the transport processes with the device performances.

Noise spectroscopy as a tool for the characterization of perovskite, organic and silicon solar cells

Landi G.
Writing – Original Draft Preparation
;
Barone C.
Writing – Original Draft Preparation
;
Mauro C.
Data Curation
;
Neitzert H. C.
Writing – Review & Editing
;
Pagano S.
Writing – Review & Editing
2019

Abstract

Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under temperature or radiation stress. For all the investigated polymer:fullerene, silicon and perovskite solar cells this technique evidences a clear correlation of the recombination and the transport processes with the device performances.
978-0-7354-1812-7
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11386/4721992
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