The planar wide-mesh scanning (PWMS) methodology is based on a non-redundant sampling scheme [1], [2] and is thus without loss of accuracy. It has the potential to enable much faster measurements than standard Planar Near Field (PNF) scanning that is based on denser, regular, equally spaced NF sampling fulfilling Nyquist criteria. In [3], the non-redundant methodology has been validated numerically by simulated measurements on a highly shaped reflector antenna and with actual measurements on a pencil beam antenna in Ku-band and on a navigation antenna in L-band.In this paper, we present the experimental verification of the PWMS methodology, at V band using dedicated PNF measurements of a Standard Gain Horn antenna MVG SGH4000.The results accuracy of the non-redundant methodology has been investigated against Far-Field patterns, implemented by standard scanning methods, by visual comparison, and by computation of the Equivalent Noise Level (ENL). The achieved under-sampling factor is equal to 12, corresponding to similar time reduction in the stepped measurement system employed for the presented validation.
Experimental Validation of Minimum Redundancy Scanning Schemes in PNF Measurements at v band
D'Agostino F.;Ferrara F.;Gennarelli C.;Guerriero R.;
2019-01-01
Abstract
The planar wide-mesh scanning (PWMS) methodology is based on a non-redundant sampling scheme [1], [2] and is thus without loss of accuracy. It has the potential to enable much faster measurements than standard Planar Near Field (PNF) scanning that is based on denser, regular, equally spaced NF sampling fulfilling Nyquist criteria. In [3], the non-redundant methodology has been validated numerically by simulated measurements on a highly shaped reflector antenna and with actual measurements on a pencil beam antenna in Ku-band and on a navigation antenna in L-band.In this paper, we present the experimental verification of the PWMS methodology, at V band using dedicated PNF measurements of a Standard Gain Horn antenna MVG SGH4000.The results accuracy of the non-redundant methodology has been investigated against Far-Field patterns, implemented by standard scanning methods, by visual comparison, and by computation of the Equivalent Noise Level (ENL). The achieved under-sampling factor is equal to 12, corresponding to similar time reduction in the stepped measurement system employed for the presented validation.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
