In the paper a lifetime control technique able to control device carrier lifetime not only in the axial direction, but also in the longitudinal direction (two-dimensional (2-D) lifetime control), is analyzed. Static and dynamic losses of p-i-n diode using 2-D lifetime control are studied through mixed mode circuit-device simulations. It is shown that the 2-D technique gives a better tradeoff between static and dynamic behavior with respect to electron irradiation technique. The comparison with axial lifetime control shows that, notwithstanding similar performances achieved using the two techniques, 2-D lifetime control provides greater design flexibility
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