Carrano, Vincenzo
Carrano, Vincenzo
Dipartimento di Ingegneria Industriale/DIIN
4H-SiC Diodes to Probe Stark Effect Detection in 7Be Decay Lifetime
2026 Boldrini, V.; Canino, M.; Pieruccini, M.; Carrano, V.; Neitzert, H. C.; Di Benedetto, L.; Santonastaso, C.; Buompane, R.; Mitsou, M. L.; Casali, N.; Yadav, R. P.; Laubenstein, M.; Boschi, C. D. E.; Rubino, A.; Formicola, A.; Gialanella, L.
CHANGE OF THE DYNAMIC PROPERTIES DUE TO IRRADIATION WITH 65 MeV PROTONS OF CMOS SMALL SCALE INTEGRATION LOGIC DEVICES USED FOR A QUANTUM YIELD MONITORING SYSTEM
2024 Carrano, Vincenzo; Bundesmann, Jürgen; Denker, Andrea; Neitzert, Heinz-Christoph
Optoelectronic Characterization of Nano-Diamond/crystalline Silicon Heterostructures
2025 Singh, Arpana; Kunst, Marinus; Sannino, Diana; Speranza, Vito; Carrano, Vincenzo; Neitzert, Heinz-Christoph
Precise measurement of the 7Be electron capture decay half-life in Silicon Carbide
2025 Santonastaso, Claudio; Casali, Nicola; Di Benedetto, Luigi; Boldrini, Virginia; Buompane, Raffaele; Canino, M; Carrano, Vincenzo; Formicola, Alba; Gialanella, Lucio; Laubenstein, Matthias; Neitzert, Heinrich-Christoph; Pieruccini, Marco; Porzio, Giuseppe; Rubino, Alfredo
Selenium, Silicon and SiC power diodes as temperature sensors, operated in different voltage regimes and under extreme conditions
2025 Neitzert, Heinz-Christoph; Singh, Arpana; Carrano, Vincenzo
Temperature dependent electrical properties and cycling stability of a highly loaded LDPE/MWCNT composite film with coplanar gold contacts
2023 Singh, A.; Carrano, V.; Neitzert, H. -C.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| 4H-SiC Diodes to Probe Stark Effect Detection in 7Be Decay Lifetime | 1-gen-2026 | Boldrini, V.; Canino, M.; Pieruccini, M.; Carrano, V.; Neitzert, H. C.; Di Benedetto, L.; Santonastaso, C.; Buompane, R.; Mitsou, M. L.; Casali, N.; Yadav, R. P.; Laubenstein, M.; Boschi, C. D. E.; Rubino, A.; Formicola, A.; Gialanella, L. | |
| CHANGE OF THE DYNAMIC PROPERTIES DUE TO IRRADIATION WITH 65 MeV PROTONS OF CMOS SMALL SCALE INTEGRATION LOGIC DEVICES USED FOR A QUANTUM YIELD MONITORING SYSTEM | 1-gen-2024 | Carrano, Vincenzo; Bundesmann, Jürgen; Denker, Andrea; Neitzert, Heinz-Christoph | |
| Optoelectronic Characterization of Nano-Diamond/crystalline Silicon Heterostructures | 1-gen-2025 | Singh, Arpana; Kunst, Marinus; Sannino, Diana; Speranza, Vito; Carrano, Vincenzo; Neitzert, Heinz-Christoph | |
| Precise measurement of the 7Be electron capture decay half-life in Silicon Carbide | 1-gen-2025 | Santonastaso, Claudio; Casali, Nicola; Di Benedetto, Luigi; Boldrini, Virginia; Buompane, Raffaele; Canino, M; Carrano, Vincenzo; Formicola, Alba; Gialanella, Lucio; Laubenstein, Matthias; Neitzert, Heinrich-Christoph; Pieruccini, Marco; Porzio, Giuseppe; Rubino, Alfredo | |
| Selenium, Silicon and SiC power diodes as temperature sensors, operated in different voltage regimes and under extreme conditions | 1-gen-2025 | Neitzert, Heinz-Christoph; Singh, Arpana; Carrano, Vincenzo | |
| Temperature dependent electrical properties and cycling stability of a highly loaded LDPE/MWCNT composite film with coplanar gold contacts | 1-gen-2023 | Singh, A.; Carrano, V.; Neitzert, H. -C. |