An efficient technique is developed in this article to extrapolate the near-field data falling outside the measurement region in the bipolar scanning. It is based on the nonredundant sampling representations of the electromagnetic field and on the optimal sampling interpolation expansions. The singular value decomposition method is properly employed for estimating the external data. This allows one to reduce in a significant way the truncation error occurring in the nearfield-far-field transformation with bipolar scanning. Numerical examples assessing the effectiveness of the technique are shown.

An efficient technique to lower the error due to the truncation of the scanning region in a bipolar facility

D'AGOSTINO, Francesco;FERRARA, Flaminio;GENNARELLI, Claudio;GUERRIERO, ROCCO;RICCIO, Giovanni;
2007-01-01

Abstract

An efficient technique is developed in this article to extrapolate the near-field data falling outside the measurement region in the bipolar scanning. It is based on the nonredundant sampling representations of the electromagnetic field and on the optimal sampling interpolation expansions. The singular value decomposition method is properly employed for estimating the external data. This allows one to reduce in a significant way the truncation error occurring in the nearfield-far-field transformation with bipolar scanning. Numerical examples assessing the effectiveness of the technique are shown.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11386/1659648
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? 1
social impact