A laboratory validation of an efficient SVD based approach for correcting known errors in the probe positioning, affecting a non-conventional plane-rectangular near to far-field transformation (NTFFT) using the planar wide-mesh scanning, is here given. Such a NTFFT employs a reduced number of near-field data, since those required by the standard plane-rectangular one are precisely recovered from them by means of a non-redundant representation of the voltage measured by the probe, achieved by considering the antenna as contained in an oblate spheroid. The values of the voltage at the sample points dictated by the representation are unknown and are efficiently retrieved from the positioning errors affected ones through the SVD based procedure. Some results of experimental tests, carried out at the University of Salerno and validating the efficacy of the proposed approach, are reported.
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