Admittance spectroscopy is employed to explain the property differences observe between organic thin film transistors (OTFTs) fabricated with various gate insulator layers based on poly(4-vinylphenol) (PVP) and poly(methyl methacrylate) (PMMA). The objective is achieved through the development of an equivalent circuit and a compact analytical model of the device core structure, namely, the metal–insulator–semiconductor (MIS) capacitor. The model fitting with experimental data allows to extract a wide range of parameters and, in particular, demonstrates the critical role played by the interface between insulator and semiconductor layers.

Polymer Insulator Processing-Organic Transistor Performance Relationship Investigated through Admittance Spectroscopy

Liguori R.
;
Licciardo G. D.;Di Benedetto L.
2022

Abstract

Admittance spectroscopy is employed to explain the property differences observe between organic thin film transistors (OTFTs) fabricated with various gate insulator layers based on poly(4-vinylphenol) (PVP) and poly(methyl methacrylate) (PMMA). The objective is achieved through the development of an equivalent circuit and a compact analytical model of the device core structure, namely, the metal–insulator–semiconductor (MIS) capacitor. The model fitting with experimental data allows to extract a wide range of parameters and, in particular, demonstrates the critical role played by the interface between insulator and semiconductor layers.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11386/4809675
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